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US Patent Issued on Sept. 29 for "Method for measuring voltage droop in a circuit using a current controlled oscillator" (Israeli Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,137, issued on Sept. 29. "Method for measuring voltage droop in a circuit using a current controlled oscillator" was invented by Joseph Sh... और पढ़ें


US Patent Issued to Electronics and Telecommunications Research Institute on Sept. 29 for "Phase discriminator for reflected waves and operating method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,138, issued on Sept. 29, was assigned to Electronics and Telecommunications Research Institute (Daejeon, South Korea). "Phase discriminato... और पढ़ें


US Patent Issued to ZHEJIANG JINKO ENERGY STORAGE on Sept. 29 for "Power conversion system and control method therefor" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,139, issued on Sept. 29, was assigned to ZHEJIANG JINKO ENERGY STORAGE Co. LTD. (Haining, China). "Power conversion system and control met... और पढ़ें


US Patent Issued to The MITRE on Sept. 29 for "Rydberg atom-based vector and polarization sensor" (Virginia Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,140, issued on Sept. 29, was assigned to The MITRE Corp. (McLean, Va.). "Rydberg atom-based vector and polarization sensor" was invented b... और पढ़ें


US Patent Issued to Electric Power Research Institute of Yunnan Power Grid on Sept. 29 for "Method and related device for locating ring power network fault" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,141, issued on Sept. 29, was assigned to Electric Power Research Institute of Yunnan Power Grid Co. Ltd. (Yunnan, China). "Method and rela... और पढ़ें


US Patent Issued to CISCO TECHNOLOGY on Sept. 29 for "Using impedance analysis for fault detection in power delivery systems" (American, Italian Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,142, issued on Sept. 29, was assigned to CISCO TECHNOLOGY INC. (San Jose, Calif.). "Using impedance analysis for fault detection in power ... और पढ़ें


US Patent Issued to Applied Materials Israel on Sept. 29 for "Measurement of a photocathode current" (Israeli Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,143, issued on Sept. 29, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Measurement of a photocathode current" was inve... और पढ़ें


US Patent Issued to ADVANTEST on Sept. 29 for "Testing apparatus for high-rate transmission and reception of signals between device under test and semiconductor testing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,144, issued on Sept. 29, was assigned to ADVANTEST Corp. (Tokyo). "Testing apparatus for high-rate transmission and reception of signals b... और पढ़ें


US Patent Issued to Keithley Instruments on Sept. 29 for "Low current leakage measurement on a high current unified static and dynamic characterization platform" (Ohio Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,145, issued on Sept. 29, was assigned to Keithley Instruments LLC (Solon, Ohio). "Low current leakage measurement on a high current unifie... और पढ़ें


US Patent Issued to Taiwan Semiconductor Manufacturing on Sept. 29 for "Systems and methods for measurement of a parameter of a DUT" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,146, issued on Sept. 29, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Systems and methods for measureme... और पढ़ें